QUANTITATIVE IMAGE ACQUISITION-SYSTEM FOR ION MICROSCOPY BASED ON THE RESISTIVE ANODE ENCODER

被引:47
作者
ODOM, RW
FURMAN, BK
EVANS, CA
BRYSON, CE
PETERSEN, WA
KELLY, MA
WAYNE, DH
机构
[1] SURFACE SCI LABS INC,MT VIEW,CA 94043
[2] CAMECA INSTRUMENTS INC,STAMFORD,CT 06902
关键词
D O I
10.1021/ac00254a036
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
摘要
引用
收藏
页码:574 / 578
页数:5
相关论文
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