TRANSIENT PHASE-SHIFT MEASUREMENTS IN AN ELECTRON-BEAM-PUMPED XEF LASER

被引：0

作者：

SCHEPS, R ^{[1
]}

OLDENETTEL, JR ^{[1
]}

HUNTER, RO ^{[1
]}

机构：

[1] MAXWELL LABS INC,SAN DIEGO,CA

来源：

IEEE JOURNAL OF QUANTUM ELECTRONICS | 1979年 / 15卷 / 09期

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：D56 / D57

页数：2

共 50 条

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