BORON-DIFFUSION WITHIN TASI2/POLY-SI GATES

被引:0
作者
SCHWALKE, U
MAZURE, C
NEPPL, F
机构
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1989年 / 7卷 / 01期
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D O I
10.1116/1.584434
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
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页码:120 / 126
页数:7
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