TEST RESEARCH IN JAPAN

被引：4

作者：

FUJIWARA, H

TAKAMATSU, Y

NANYA, T

YAMADA, T

TAMAMOTO, H

FURUYA, K

机构：

[1] CHUO UNIV,DEPT ELECT ENGN,TOKYO,JAPAN

[2] EHIME UNIV,DEPT COMP SCI,MATSUYAMA,EHIME 790,JAPAN

[3] TOKYO INST TECHNOL,DEPT COMP SCI,TOKYO 152,JAPAN

[4] AKITA UNIV,COLL MIN,DEPT ELECTR ENGN,AKITA 010,JAPAN

来源：

IEEE DESIGN & TEST OF COMPUTERS | 1988年 / 5卷 / 05期

关键词：

D O I：

10.1109/54.7982

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

引用

页码：60 / 79

页数：20

共 67 条

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