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STRUCTURE OF CHEMICALLY DEPOSITED POLYCRYSTALLINE-SILICON FILMS
被引:99
作者
:
KAMINS, TI
论文数:
0
引用数:
0
h-index:
0
机构:
FAIRCHILD CAMERA & INSTR CORP,RES & DEV LAB,PALO ALTO,CA 94304
FAIRCHILD CAMERA & INSTR CORP,RES & DEV LAB,PALO ALTO,CA 94304
KAMINS, TI
[
1
]
CASS, TR
论文数:
0
引用数:
0
h-index:
0
机构:
FAIRCHILD CAMERA & INSTR CORP,RES & DEV LAB,PALO ALTO,CA 94304
FAIRCHILD CAMERA & INSTR CORP,RES & DEV LAB,PALO ALTO,CA 94304
CASS, TR
[
1
]
机构
:
[1]
FAIRCHILD CAMERA & INSTR CORP,RES & DEV LAB,PALO ALTO,CA 94304
来源
:
THIN SOLID FILMS
|
1973年
/ 16卷
/ 02期
关键词
:
D O I
:
10.1016/0040-6090(73)90164-8
中图分类号
:
T [工业技术];
学科分类号
:
08 ;
摘要
:
引用
收藏
页码:147 / 165
页数:19
相关论文
共 31 条
[1]
THICKNESS MEASUREMENT OF EPITAXIAL FILMS BY THE INFRARED INTERFERENCE METHOD
ALBERT, MP
论文数:
0
引用数:
0
h-index:
0
ALBERT, MP
COMBS, JF
论文数:
0
引用数:
0
h-index:
0
COMBS, JF
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1962,
109
(08)
: 709
-
713
[2]
ELLIPSOMETRY IN SUB-MONOLAYER REGION
BOOTSMA, GA
论文数:
0
引用数:
0
h-index:
0
机构:
Philips Research Laboratories, N.V. Philips' Gloeilampenfabrieken, Eindhoven
BOOTSMA, GA
MEYER, F
论文数:
0
引用数:
0
h-index:
0
机构:
Philips Research Laboratories, N.V. Philips' Gloeilampenfabrieken, Eindhoven
MEYER, F
[J].
SURFACE SCIENCE,
1969,
14
(01)
: 52
-
&
[3]
STRUCTURAL, OPTICAL, AND ELECTRICAL PROPERTIES OF AMORPHOUS SILICON FILMS
BRODSKY, MH
论文数:
0
引用数:
0
h-index:
0
BRODSKY, MH
TITLE, RS
论文数:
0
引用数:
0
h-index:
0
TITLE, RS
WEISER, K
论文数:
0
引用数:
0
h-index:
0
WEISER, K
PETTIT, GD
论文数:
0
引用数:
0
h-index:
0
PETTIT, GD
[J].
PHYSICAL REVIEW B,
1970,
1
(06):
: 2632
-
&
[4]
ENHANCEMENT OF BREAKDOWN PROPERTIES OF OVERLAY ANNULAR DIODES BY FIELD SHAPING RESISTIVE FILMS
CLARK, LE
论文数:
0
引用数:
0
h-index:
0
CLARK, LE
ZOROGLU, DS
论文数:
0
引用数:
0
h-index:
0
ZOROGLU, DS
[J].
SOLID-STATE ELECTRONICS,
1972,
15
(06)
: 653
-
+
[5]
TEXTURAL PROPERTIES OF GERMANIUM FILMS
DAVEY, JE
论文数:
0
引用数:
0
h-index:
0
DAVEY, JE
[J].
JOURNAL OF APPLIED PHYSICS,
1961,
32
(05)
: 877
-
&
[6]
NONDESTRUCTIVE THICKNESS DETERMINATION OF POLYCRYSTALLINE SILICON DEPOSITED ON OXIDIZED SILICON
DELLOCA, CJ
论文数:
0
引用数:
0
h-index:
0
DELLOCA, CJ
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1972,
119
(01)
: 108
-
&
[7]
DELLOCA CJ, PERSONAL COMMUNICATI
[8]
SILICON GATE TECHNOLOGY
FAGGIN, F
论文数:
0
引用数:
0
h-index:
0
FAGGIN, F
KLEIN, T
论文数:
0
引用数:
0
h-index:
0
KLEIN, T
[J].
SOLID-STATE ELECTRONICS,
1970,
13
(08)
: 1125
-
&
[9]
STRUCTURE OF SILICON FILMS DEPOSITED ON OXIDIZED SILICON WAFERS
FRIPP, AL
论文数:
0
引用数:
0
h-index:
0
FRIPP, AL
CATLIN, A
论文数:
0
引用数:
0
h-index:
0
CATLIN, A
STERMER, RL
论文数:
0
引用数:
0
h-index:
0
STERMER, RL
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1970,
117
(12)
: 1569
-
&
[10]
GUALTIERI JG, 1960, Z KRISTALLOGR, V114, P9
←
1
2
3
4
→
共 31 条
[1]
THICKNESS MEASUREMENT OF EPITAXIAL FILMS BY THE INFRARED INTERFERENCE METHOD
ALBERT, MP
论文数:
0
引用数:
0
h-index:
0
ALBERT, MP
COMBS, JF
论文数:
0
引用数:
0
h-index:
0
COMBS, JF
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1962,
109
(08)
: 709
-
713
[2]
ELLIPSOMETRY IN SUB-MONOLAYER REGION
BOOTSMA, GA
论文数:
0
引用数:
0
h-index:
0
机构:
Philips Research Laboratories, N.V. Philips' Gloeilampenfabrieken, Eindhoven
BOOTSMA, GA
MEYER, F
论文数:
0
引用数:
0
h-index:
0
机构:
Philips Research Laboratories, N.V. Philips' Gloeilampenfabrieken, Eindhoven
MEYER, F
[J].
SURFACE SCIENCE,
1969,
14
(01)
: 52
-
&
[3]
STRUCTURAL, OPTICAL, AND ELECTRICAL PROPERTIES OF AMORPHOUS SILICON FILMS
BRODSKY, MH
论文数:
0
引用数:
0
h-index:
0
BRODSKY, MH
TITLE, RS
论文数:
0
引用数:
0
h-index:
0
TITLE, RS
WEISER, K
论文数:
0
引用数:
0
h-index:
0
WEISER, K
PETTIT, GD
论文数:
0
引用数:
0
h-index:
0
PETTIT, GD
[J].
PHYSICAL REVIEW B,
1970,
1
(06):
: 2632
-
&
[4]
ENHANCEMENT OF BREAKDOWN PROPERTIES OF OVERLAY ANNULAR DIODES BY FIELD SHAPING RESISTIVE FILMS
CLARK, LE
论文数:
0
引用数:
0
h-index:
0
CLARK, LE
ZOROGLU, DS
论文数:
0
引用数:
0
h-index:
0
ZOROGLU, DS
[J].
SOLID-STATE ELECTRONICS,
1972,
15
(06)
: 653
-
+
[5]
TEXTURAL PROPERTIES OF GERMANIUM FILMS
DAVEY, JE
论文数:
0
引用数:
0
h-index:
0
DAVEY, JE
[J].
JOURNAL OF APPLIED PHYSICS,
1961,
32
(05)
: 877
-
&
[6]
NONDESTRUCTIVE THICKNESS DETERMINATION OF POLYCRYSTALLINE SILICON DEPOSITED ON OXIDIZED SILICON
DELLOCA, CJ
论文数:
0
引用数:
0
h-index:
0
DELLOCA, CJ
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1972,
119
(01)
: 108
-
&
[7]
DELLOCA CJ, PERSONAL COMMUNICATI
[8]
SILICON GATE TECHNOLOGY
FAGGIN, F
论文数:
0
引用数:
0
h-index:
0
FAGGIN, F
KLEIN, T
论文数:
0
引用数:
0
h-index:
0
KLEIN, T
[J].
SOLID-STATE ELECTRONICS,
1970,
13
(08)
: 1125
-
&
[9]
STRUCTURE OF SILICON FILMS DEPOSITED ON OXIDIZED SILICON WAFERS
FRIPP, AL
论文数:
0
引用数:
0
h-index:
0
FRIPP, AL
CATLIN, A
论文数:
0
引用数:
0
h-index:
0
CATLIN, A
STERMER, RL
论文数:
0
引用数:
0
h-index:
0
STERMER, RL
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1970,
117
(12)
: 1569
-
&
[10]
GUALTIERI JG, 1960, Z KRISTALLOGR, V114, P9
←
1
2
3
4
→