TEMPERATURE DEPENDENCE OF RNA BREAKDOWN IN A THERMOPHILIC BACILLUS

被引:3
|
作者
GRINSTED, J
机构
关键词
D O I
10.1016/0005-2787(69)90540-1
中图分类号
Q5 [生物化学]; Q7 [分子生物学];
学科分类号
071010 ; 081704 ;
摘要
引用
收藏
页码:248 / &
相关论文
共 50 条
  • [31] Xylanase produced by Bacillus thermoantarcticus, a new thermophilic bacillus
    Lama, L
    Nicolaus, B
    Calandrelli, V
    Esposito, E
    Gambacorta, A
    ENZYME ENGINEERING XIII, 1996, 799 : 284 - 289
  • [32] Temperature dependence and conduction mechanism after analog soft breakdown
    Nigam, T
    Martin, S
    Abusch-Magder, D
    41ST ANNUAL PROCEEDINGS: INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM, 2003, : 417 - 423
  • [33] Temperature Dependence of Electrical Breakdown Mechanism on the Left of the Paschen Minimum
    Sili, Elyse
    Cambronne, Jean-Pascal
    Koliatene, Flavien
    IEEE TRANSACTIONS ON PLASMA SCIENCE, 2011, 39 (11) : 3173 - 3179
  • [34] Temperature Dependence of Resistance of Conductive Filament Formed by Dielectric Breakdown
    Otsuka, Shintaro
    Kato, Takashi
    Kyomi, Takuya
    Hamada, Yoshifumi
    Tada, Yoshihiro
    Shimizu, Tomohiro
    Shingubara, Shoso
    JAPANESE JOURNAL OF APPLIED PHYSICS, 2013, 52 (06)
  • [35] Dielectric Breakdown of Polyimide Films: Area, Thickness and Temperature Dependence
    Diaham, S.
    Zelmat, S.
    Locatelli, M. -L.
    Dinculescu, S.
    Decup, M.
    Lebey, T.
    IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION, 2010, 17 (01) : 18 - 27
  • [36] TEMPERATURE DEPENDENCE OF BREAKDOWN FIELD OF CERAMIC BATIO3
    UEDA, I
    SATO, H
    IKEGAMI, S
    TAKIUCHI, M
    JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, 1962, 17 (10) : 1679 - &
  • [37] DEPENDENCE OF THE BREAKDOWN VOLTAGE OF BILAYER LIPID-MEMBRANES ON TEMPERATURE
    MIKAELIAN, LM
    HODJIAN, SA
    BIOFIZIKA, 1981, 26 (02): : 357 - 358
  • [38] Temperature dependence of breakdown voltage in AlxGa1-xAs
    Groves, C
    Harrison, CN
    David, JPR
    Rees, GJ
    JOURNAL OF APPLIED PHYSICS, 2004, 96 (09) : 5017 - 5019
  • [39] Interrelationship of voltage and temperature dependence of oxide breakdown for ultrathin oxides
    Wu, EY
    Harmon, DL
    Han, LK
    IEEE ELECTRON DEVICE LETTERS, 2000, 21 (07) : 362 - 364
  • [40] Temperature dependence of GaN high breakdown voltage diode rectifiers
    Chyi, JI
    Lee, CM
    Chuo, CC
    Cao, XA
    Dang, GT
    Zhang, AP
    Ren, F
    Pearton, SJ
    Chu, SNG
    Wilson, RG
    SOLID-STATE ELECTRONICS, 2000, 44 (04) : 613 - 617