FUNDAMENTAL MODELING OF THE TURN-OFF BEHAVIOR OF POWER BIPOLAR-TRANSISTORS

被引:5
|
作者
JOHNSON, MK
GOUGH, PA
机构
[1] Philips Research Laboratories, Redhill, Surrey RH1 5HA, Cross Oak Lane
关键词
D O I
10.1016/0038-1101(90)90165-B
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The 2-D device simulator, Hector, has been extended to model time dependent device behaviour in the presence of multiple circuit boundary conditions. Results are presented from a study in which Hector was used to investigate the turn-off of a power bipolar transistor. Two distinct forms of plasma removal are demonstrated, the dominant mechanism depending on the switching conditions. Also, other features in the I-V waveforms are explained in terms of interaction between the device structure and the switching circuit. Experimental results are shown to agree qualitatively with the simulations. Finally, this modelling work reveals inadequacies in the conventional discretisation schemes used in the solution of the semiconductor device equations. © 1990.
引用
收藏
页码:259 / 272
页数:14
相关论文
共 50 条
  • [1] ON THE REVERSE BIAS SAFE OPERATING AREA OF POWER BIPOLAR-TRANSISTORS DURING INDUCTIVE TURN-OFF
    FRATELLI, L
    VITALE, GF
    SOLID-STATE ELECTRONICS, 1994, 37 (02) : 275 - 287
  • [2] TURN-OFF CHARACTERISTICS OF POWER TRANSISTORS USING EMITTER-OPEN TURN-OFF
    CHEN, DY
    JACKSON, B
    IEEE TRANSACTIONS ON AEROSPACE AND ELECTRONIC SYSTEMS, 1981, 17 (03) : 386 - 391
  • [3] MODEL FOR THE TURN-OFF BEHAVIOR OF MOS-TRANSISTORS
    GRIMMER, F
    GOSER, K
    ARCHIV FUR ELEKTRONIK UND UBERTRAGUNGSTECHNIK, 1972, 26 (05): : 197 - &
  • [4] Effects of metallization lay-out on turn-off failure of modern power bipolar transistors
    Busatto, G
    Conte, A
    Patti, A
    MICROELECTRONICS AND RELIABILITY, 1996, 36 (11-12): : 1867 - 1870
  • [5] Effects of metallization lay-out on turn-off failure of modern power bipolar transistors
    Univ of Napoli `Federico II', Naples, Italy
    Microelectron Reliab, 11-12 (1867-1870):
  • [6] MODELING THE TURN-OFF CHARACTERISTICS OF THE BIPOLAR-MOS TRANSISTOR
    KUO, DS
    CHOI, JY
    GIANDOMENICO, D
    HU, C
    SAPP, SP
    SASSAMAN, KA
    BREGAR, R
    IEEE ELECTRON DEVICE LETTERS, 1985, 6 (05) : 211 - 214
  • [7] Simulation of Turn-off Oscillation Suppression in Silicon Insulated Gate Bipolar Transistors
    Machida, Satoru
    Nomura, Katsuya
    2017 INTERNATIONAL CONFERENCE ON SIMULATION OF SEMICONDUCTOR PROCESSES AND DEVICES (SISPAD 2017), 2017, : 257 - 260
  • [8] Turn-off overvoltage characterization and mitigation in wide bandgap power transistors
    Deng, Junyun
    Peters, Dinar
    Wang, Wenbo
    Venugopal, Prasanth
    Popovic, Jelena
    Ferreira, Braham
    2021 23RD EUROPEAN CONFERENCE ON POWER ELECTRONICS AND APPLICATIONS (EPE'21 ECCE EUROPE), 2021,
  • [9] Modeling the turn-off characteristics of insulated-gate bipolar transistor
    Huang, Tsung-Yi
    Gong, Jeng
    Chen, Shin-Hui
    Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 2002, 41 (3 A): : 1288 - 1292
  • [10] Modeling the turn-off characteristics of insulated-gate bipolar transistor
    Huang, TY
    Gong, J
    Chen, SH
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 2002, 41 (3A): : 1288 - 1292