NEW DIRECT METHOD FOR CHARACTERIZING STRUCTURES WITH STACKING-FAULTS, BUILT UP FROM TRANSLATIONALLY EQUIVALENT LAYERS .2. FAULTS IN 5-LAYER STRUCTURE ELEMENTS

被引：14
作者：
FARKASJAHNKE, M [1 ]
机构：
[1] HUNGARIAN ACAD SCI, RES INST TECH PHYS, BUDAPEST, HUNGARY
来源：
ACTA CRYSTALLOGRAPHICA SECTION B-STRUCTURAL SCIENCE CRYSTAL ENGINEERING AND MATERIALS | 1973年 / 29卷 / MAR15期
关键词：
D O I：
10.1107/S0567740873002694
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
引用
收藏
页码：413 / 420
页数：8
相关论文
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ACTA CRYSTALLOGRAPHICA SECTION A-CRYSTAL PHYSICS DIFFRACTION THEORETICAL AND GENERAL CRYSTALLOGRAPHY, 1970, A 26 :24-&
[2]  
DORNBERGERSCHIF.K, 1972, KRISTALLOGRAFIYA, V16, P1247
[3]   NEW DIRECT METHOD FOR CHARACTERIZING STRUCTURES WITH STACKING-FAULTS, BUILT UP FROM TRANSLATIONALLY EQUIVALENT LAYERS .1. FAULTS IN STACKINGS OF 3 AND 4 LAYERS [J].
FARKASJAHNKE, M .
ACTA CRYSTALLOGRAPHICA SECTION B-STRUCTURAL SCIENCE CRYSTAL ENGINEERING AND MATERIALS, 1973, 29 (MAR15) :407-+
[4]  
FARKASJAHNKE M, 1971, 1 EUR C PHYS COND MA
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