IMAGING XE WITH A LOW-TEMPERATURE SCANNING TUNNELING MICROSCOPE

被引：226

作者：

EIGLER, DM ^{[1
]}

WEISS, PS ^{[1
]}

SCHWEIZER, EK ^{[1
]}

LANG, ND ^{[1
]}

机构：

[1] IBM CORP,THOMAS J WATSON RES CTR,DIV RES,YORKTOWN HTS,NY 10598

来源：

PHYSICAL REVIEW LETTERS | 1991年 / 66卷 / 09期

关键词：

D O I：

10.1103/PhysRevLett.66.1189

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

We have obtained images of individual Xe atoms absorbed on a Ni(110) surface using a low-temperature scanning tunneling microscope (STM). The atom-on-jellium model has been used to calculate the apparent height of a Xe atom as imaged with the STM and the result is found to be in good agreement with experiment. We conclude that the Xe 6s resonance, although lying close to the vacuum level, is the origin of the Fermi-level local state density which renders Xe "visible" in the STM.

引用

页码：1189 / 1192

页数：4

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