HYBRID E-BEAM-DEEP-UV EXPOSURE USING PORTABLE CONFORMABLE MASKING (PCM) TECHNIQUE

被引:61
作者
LIN, BJ
CHANG, THP
机构
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY | 1979年 / 16卷 / 06期
关键词
D O I
10.1116/1.570269
中图分类号
O59 [应用物理学];
学科分类号
摘要
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页码:1669 / 1671
页数:3
相关论文
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