DEVICE FOR MEASUREMENT OF THE ELECTRICAL PROPERTIES OF BI2SE3 AT ELEVATED TEMPERATURES

被引:11
作者
SMITH, MJ
KIRK, ES
SPENCER, CW
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D O I
10.1063/1.1735877
中图分类号
O59 [应用物理学];
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页码:1504 / 1505
页数:2
相关论文
共 5 条
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[3]   APPARATUS FOR MEASURING RESISTIVITY AND HALL COEFFICIENT OF SEMICONDUCTORS [J].
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