共 50 条
- [33] MEASUREMENTS OF CHARGE CARRIER LIFETIME IN P+-N-N+ STRUCTURES WITH BUILT-IN FIELDS IN BASE REGIONS RADIOTEKHNIKA I ELEKTRONIKA, 1979, 24 (10): : 2107 - 2114
- [36] Electrical and low frequency noise properties of 4H-SiC p+-n-n+ junction diodes PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 2006, 203 (10): : 2551 - 2557
- [38] Bias-dependent annealing of radiation damage in neutron-irradiated silicon p+-n-n+ diodes NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1998, 419 (01): : 132 - 136