SPECIMEN CONTAMINATION IN ELECTRON MICROSCOPES

被引：15
作者：
WATSON, JHL
机构：
来源：
JOURNAL OF APPLIED PHYSICS | 1948年 / 19卷 / 01期
关键词：
D O I：
10.1063/1.1697863
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
引用
收藏
页码：110 / 111
页数：2
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