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- [1] A DIFFRACTION SPECIMEN HOLDER FOR ELECTRON MICROSCOPESREVIEW OF SCIENTIFIC INSTRUMENTS, 1945, 16 (06): : 146 - 148SIMARD, GLSTRYKER, CR
- [2] AN IMPROVED STANDARD SPECIMEN FOR ALIGNMENT OF ELECTRON MICROSCOPESJOURNAL OF SCIENTIFIC INSTRUMENTS, 1967, 44 (12): : 1036 - &CARSON, KRRUDEE, ML
- [3] SPECIMEN CONTAMINATION IN THE ELECTRON MICROPROBEJOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1964, 111 (08) : C201 - C201CAMPBELL, AJGIBBONS, R
- [4] A SPECIMEN MOUNT ADAPTER FOR AMRAY ELECTRON-MICROSCOPESJOURNAL OF ELECTRON MICROSCOPY TECHNIQUE, 1985, 2 (06): : 647 - 647CACECI, T
- [6] SPECIMEN CONTAMINATION IN ELECTRON-MICROSCOPEJOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, 1956, 11 (04) : 463 - 464MIZUSHIMA, YHIROTA, SNOAKE, H
- [7] ON THE INVESTIGATION OF SPECIMEN CONTAMINATION IN THE ELECTRON MICROSCOPEJOURNAL OF APPLIED PHYSICS, 1948, 19 (03) : 226 - 230HILLIER, J
- [8] THE ORIGIN OF SPECIMEN CONTAMINATION IN THE ELECTRON MICROSCOPEBRITISH JOURNAL OF APPLIED PHYSICS, 1953, 4 (APR): : 101 - 106ENNOS, AE
- [9] SPECIMEN CONTAMINATION IN ELECTRON-MICROSCOPYJOURNAL OF ELECTRON MICROSCOPY, 1979, 28 (01): : 58 - 58MIHAMA, K
- [10] CONTROLLING PARAMETER IN CONTAMINATION OF SPECIMENS IN ELECTRON-MICROSCOPESOPTIK, 1975, 44 (01): : 111 - 114FOURIE, JT