USE OF SECONDARY ION MASS-SPECTROMETRY FOR STUDIES OF OXYGEN-ADSORPTION AND OXIDATION

被引：50
作者：
WITTMAACK, K [1 ]
机构：
[1] GESELL STRAHLEN & UMWELTFORSCH MBH,PHYS TECH ABT,D-8042 NEUHERBERG,FED REP GER
来源：
SURFACE SCIENCE | 1977年 / 68卷 / 01期
关键词：
D O I：
10.1016/0039-6028(77)90196-0
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
引用
收藏
页码：118 / 129
页数：12
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