MICROSCOPE IMAGING THROUGH HIGHLY SCATTERING MEDIA

被引:70
作者
ANDERSON, GE
LIU, F
ALFANO, RR
机构
[1] CUNY CITY COLL,NEW YORK STATE CTR ADV TECHNOL ULTRAFAST PHOTON MAT & APPLICAT,NEW YORK,NY 10031
[2] CUNY,GRAD SCH,NEW YORK,NY 10031
关键词
Microscopic examination;
D O I
10.1364/OL.19.000981
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Microscopic images of a test chart hidden behind a slab of a highly scattering medium were significantly improved by incorporation of a spatial filter located at the back Fourier-transform plane of the objective lens of a microscope. The image quality was shown to be improved further by detection of only the early-arriving photons through time-resolved detection in combination with spatial filtering.
引用
收藏
页码:981 / 983
页数:3
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