OBSERVATION OF A 0.055-NM SPACING LATTICE IMAGE IN GOLD USING A FIELD-EMISSION ELECTRON-MICROSCOPE

被引:50
作者
KAWASAKI, T
MATSUDA, T
ENDO, J
TONOMURA, A
机构
[1] Advanced Research Laboratory, Hitachi Ltd, Kokubunji, Tokyo
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS | 1990年 / 29卷 / 03期
关键词
Field emission electron microscope; Lattice resolution; Magnetic-field-superimposed field emission gun;
D O I
10.1143/JJAP.29.L508
中图分类号
O59 [应用物理学];
学科分类号
摘要
A 350 kV electron microscope equipped with a magnetic-field-superimposed field emission gun has been developed. A 0.055 nm-spacing lattice image in a gold thin film has been successfully observed with this electron microscope under the condition of 300 kV electron accelerating voltage. © 1990 The Japan Society of Applied Physics.
引用
收藏
页码:L508 / L510
页数:3
相关论文
共 9 条
[1]  
Dowell WCT., 1963, OPTIK, V20, P535
[2]  
Komoda T., 1966, JPN J APPL PHYS, V3, P122, DOI 10.1143/JJAP.3.122
[3]  
Komota T., 1964, OPTIK, V21, P93
[4]   OBSERVATION OF LATTICE IMAGES WITH A FIELD-EMISSION ELECTRON-MICROSCOPE [J].
MATSUDA, T ;
TONOMURA, A ;
KOMODA, T .
JAPANESE JOURNAL OF APPLIED PHYSICS, 1978, 17 (11) :2073-2074
[6]  
TONOMURA A, 1979, J ELECTRON MICROSC, V28, P1
[7]   SPHERICAL-ABERRATION CORRECTION OF AN ELECTRON LENS BY HOLOGRAPHY [J].
TONOMURA, A ;
MATSUDA, T ;
ENDO, J .
JAPANESE JOURNAL OF APPLIED PHYSICS, 1979, 18 (07) :1373-1377
[8]  
TROYON M, 1980, OPTIK, V57, P401
[9]  
YADA K, 1969, J ELECTRONMICROSC, V18, P266