OBSERVATION OF A 0.055-NM SPACING LATTICE IMAGE IN GOLD USING A FIELD-EMISSION ELECTRON-MICROSCOPE

被引：50

作者：

KAWASAKI, T

MATSUDA, T

ENDO, J

TONOMURA, A

机构：

[1] Advanced Research Laboratory, Hitachi Ltd, Kokubunji, Tokyo

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS | 1990年 / 29卷 / 03期

关键词：

Field emission electron microscope; Lattice resolution; Magnetic-field-superimposed field emission gun;

D O I：

10.1143/JJAP.29.L508

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

A 350 kV electron microscope equipped with a magnetic-field-superimposed field emission gun has been developed. A 0.055 nm-spacing lattice image in a gold thin film has been successfully observed with this electron microscope under the condition of 300 kV electron accelerating voltage. © 1990 The Japan Society of Applied Physics.

引用

页码：L508 / L510

页数：3

共 9 条

[1] Dowell WCT., 1963, OPTIK, V20, P535
[2] Komoda T., 1966, JPN J APPL PHYS, V3, P122, DOI 10.1143/JJAP.3.122
[3] Komota T., 1964, OPTIK, V21, P93
[4] OBSERVATION OF LATTICE IMAGES WITH A FIELD-EMISSION ELECTRON-MICROSCOPE
MATSUDA, T
TONOMURA, A
KOMODA, T
[J]. JAPANESE JOURNAL OF APPLIED PHYSICS, 1978, 17 (11) : 2073 - 2074
[5] THE DIRECT STUDY BY ELECTRON MICROSCOPY OF CRYSTAL LATTICES AND THEIR IMPERFECTIONS
MENTER, JW
[J]. PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1956, 236 (1204) : 119 - +
[6] TONOMURA A, 1979, J ELECTRON MICROSC, V28, P1
[7] SPHERICAL-ABERRATION CORRECTION OF AN ELECTRON LENS BY HOLOGRAPHY
TONOMURA, A
MATSUDA, T
ENDO, J
[J]. JAPANESE JOURNAL OF APPLIED PHYSICS, 1979, 18 (07) : 1373 - 1377
[8] TROYON M, 1980, OPTIK, V57, P401
[9] YADA K, 1969, J ELECTRONMICROSC, V18, P266

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