EXPERIMENTAL-DETERMINATION OF MINORITY-CARRIER LIFETIME AND RECOMBINATION MECHANISMS IN P-TYPE HG1-XCDXTE

被引：57
作者：
POLLA, DL
TOBIN, SP
REINE, MB
SOOD, AK
机构：
[1] MIT,FRANCIS BITTER NATL MAGNET LAB,CAMBRIDGE,MA 02139
[2] MIT,DEPT ELECT ENGN & COMP SCI,CAMBRIDGE,MA 02139
来源：
JOURNAL OF APPLIED PHYSICS | 1981年 / 52卷 / 08期
关键词：
D O I：
10.1063/1.329421
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
引用
收藏
页码：5182 / 5194
页数：13
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