STRUCTURAL TRANSITIONS OF THE CAF2/SI(111) INTERFACE

被引：39

作者：

LUCAS, CA ^{[1
]}

WONG, GCL ^{[1
]}

LORETTO, D ^{[1
]}

机构：

[1] UNIV CALIF BERKELEY,DEPT PHYS,BERKELEY,CA 94720

来源：

PHYSICAL REVIEW LETTERS | 1993年 / 70卷 / 12期

关键词：

D O I：

10.1103/PhysRevLett.70.1826

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

We have used x-ray reflectivity and transmission electron microscopy to study the CaF2/Si(111) interface. The results are consistent with a reconstructed two-layer CaF interface which can be transformed to a different structure simply by increasing the thickness of the CaF2 overlayer. We are able to reconcile previous measurements of the interface structure and gain insight into the rich variety of phenomena that may be observed at heteroepitaxial interfaces.

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页码：1826 / 1829

页数：4

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