OPTIMIZATION OF LAYERED SYNTHETIC MICROSTRUCTURES FOR BROAD-BAND REFLECTIVITY AT SOFT-X-RAY AND EUV WAVELENGTHS

被引:26
作者
MEEKINS, JF
CRUDDACE, RG
GURSKY, H
机构
来源
APPLIED OPTICS | 1987年 / 26卷 / 06期
关键词
D O I
10.1364/AO.26.000990
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
引用
收藏
页码:990 / 994
页数:5
相关论文
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Henke B. L., 1982, Atomic Data and Nuclear Data Tables, V27, P1, DOI 10.1016/0092-640X(82)90002-X
[4]  
HUNTER WR, 1984, COMMUNICATION
[5]   OPTIMIZATION OF LAYERED SYNTHETIC MICROSTRUCTURES FOR NARROW-BAND REFLECTIVITY AT SOFT-X-RAY AND EUV WAVELENGTHS [J].
MEEKINS, JF ;
CRUDDACE, RG ;
GURSKY, H .
APPLIED OPTICS, 1986, 25 (16) :2757-2763
[6]  
SPILLER E, 1974, SPACE OPTICS, P581