ATOMIC RESOLUTION ON THE AGBR(001) SURFACE BY ATOMIC FORCE MICROSCOPY

被引：37

作者：

MEYER, E ^{[1
]}

GUNTHERODT, HJ ^{[1
]}

HAEFKE, H ^{[1
]}

GERTH, G ^{[1
]}

KROHN, M ^{[1
]}

机构：

[1] INST SOLID STATE PHYS & ELECTRON MICROSCOPY,O-4050 HALLE,GERMANY

来源：

EUROPHYSICS LETTERS | 1991年 / 15卷 / 03期

关键词：

D O I：

10.1209/0295-5075/15/3/015

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

Surfaces of epitaxially grown AgBr(001) films have been examined by atomic force microscopy. Terraced-growth hills and pits as well as screw dislocations are observed and typical step heights are found to be 2.9 angstrom, which correspond to one atomic layer. At higher magnification, atomic resolution is achieved. The protrusions are regularly arranged in a square lattice having a spacing of 4.1 angstrom. Comparison with the contact hard-sphere model and theoretical calculations indicate that the protrusions can be attributed to the bromine ions, whereas the smaller silver ions are not observed. The results are discussed in relation to other techniques such as the noble-metal decoration.

引用

页码：319 / 323

页数：5

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