SIMULTANEOUS SIMS, EID, AND FLASH-FILAMENT INVESTIGATIONS OF INTERACTION OF GASES WITH A TUNGSTEN SURFACE

被引:31
作者
BENNINGHOVEN, A
TREITZ, N
LOEBACH, E
机构
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY | 1972年 / 9卷 / 02期
关键词
D O I
10.1116/1.1317728
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:600 / +
页数:1
相关论文
共 14 条
[1]   TANDEM MASS SPECTROMETER FOR SECONDARY ION STUDIES [J].
BENNINGHOVEN, A ;
LOEBACH, E .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1971, 42 (01) :49-+
[2]   Observing surface oxidation of molybdenum with the statical method of secondary ion mass spectroscopy [J].
Benninghoven, A. .
CHEMICAL PHYSICS LETTERS, 1970, 6 (06) :626-628
[3]   ANALYSIS OF MONOMOLECULAR LAYERS OF SOLIDS BY SECONDARY ION EMISSION [J].
BENNINGHOVEN, A .
ZEITSCHRIFT FUR PHYSIK, 1970, 230 (05) :403-+
[4]  
KLOPFER A, 1970, VAKUUM-TECH, V19, P1
[5]  
KLOPFER A, 1970, VAKUUM-TECH, V19, P167
[6]   ADSORPTION OF CO ON (110) PLANE OF TUNGSTEN [J].
KOHRT, C .
SURFACE SCIENCE, 1971, 24 (01) :77-&
[7]  
Kutsenko E. N., 1969, Zhurnal Tekhnicheskoi Fiziki, V39, P942
[8]  
KUTSENKO EN, 1969, SOV PHYS TECH PHYS-U, V14, P706
[9]  
LOEBACH E, 1971, THESIS KOLN