PRECISE MEASUREMENT OF WAVELENGTHS IN INFRARED SPECTRA

被引：37

作者：

PLYLER, EK

BLAINE, LR

TIDWELL, ED

机构：

来源：

JOURNAL OF RESEARCH OF THE NATIONAL BUREAU OF STANDARDS | 1955年 / 55卷 / 05期

关键词：

D O I：

10.6028/jres.055.032

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：279 / 284

页数：6

共 13 条

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KOSTKOWSKI, HJ .

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[5] INFRARED EMISSION SPECTRA OF KRYPTON AND ARGON [J].

HUMPHREYS, CJ ;

PLYLER, EK .

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[6]

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[7]

MEGGERS WF, 1934, J RES NBS, V13, P292

[8]

MOUTON ML, 1879, J PHYS, V8, P393

[9]

PASCHEN F, 1934, HDB SPECTROSCOPIE, V7, P669

[10]

PLYLER, 1955, J OPT SOC AM, V45, P103