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ROUGHNESS MEASUREMENTS OF METAL-SURFACES USING LASER SPECKLE
被引:48
作者
:
FUJII, H
论文数:
0
引用数:
0
h-index:
0
机构:
HOKKAIDO UNIV,APPL ELECT RES INST,SAPPORO,HOKKAIDO 060,JAPAN
HOKKAIDO UNIV,APPL ELECT RES INST,SAPPORO,HOKKAIDO 060,JAPAN
FUJII, H
[
1
]
ASAKURA, T
论文数:
0
引用数:
0
h-index:
0
机构:
HOKKAIDO UNIV,APPL ELECT RES INST,SAPPORO,HOKKAIDO 060,JAPAN
HOKKAIDO UNIV,APPL ELECT RES INST,SAPPORO,HOKKAIDO 060,JAPAN
ASAKURA, T
[
1
]
机构
:
[1]
HOKKAIDO UNIV,APPL ELECT RES INST,SAPPORO,HOKKAIDO 060,JAPAN
来源
:
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA
|
1977年
/ 67卷
/ 09期
关键词
:
D O I
:
10.1364/JOSA.67.001171
中图分类号
:
O4 [物理学];
学科分类号
:
0702 ;
摘要
:
引用
收藏
页码:1171 / 1176
页数:6
相关论文
共 15 条
[11]
SURFACE-ROUGHNESS MEASUREMENT BY USING SPECKLE PATTERN
OHTSUBO, J
论文数:
0
引用数:
0
h-index:
0
机构:
HOKKAIDO UNIV,RES INST APPL ELECT,SAPPORO 060,HOKKAIDO,JAPAN
HOKKAIDO UNIV,RES INST APPL ELECT,SAPPORO 060,HOKKAIDO,JAPAN
OHTSUBO, J
FUJII, H
论文数:
0
引用数:
0
h-index:
0
机构:
HOKKAIDO UNIV,RES INST APPL ELECT,SAPPORO 060,HOKKAIDO,JAPAN
HOKKAIDO UNIV,RES INST APPL ELECT,SAPPORO 060,HOKKAIDO,JAPAN
FUJII, H
ASAKURA, T
论文数:
0
引用数:
0
h-index:
0
机构:
HOKKAIDO UNIV,RES INST APPL ELECT,SAPPORO 060,HOKKAIDO,JAPAN
HOKKAIDO UNIV,RES INST APPL ELECT,SAPPORO 060,HOKKAIDO,JAPAN
ASAKURA, T
[J].
JAPANESE JOURNAL OF APPLIED PHYSICS,
1975,
14
: 293
-
298
[12]
TANAKA S, 1975, JPN J APPL PHYS S, V14
[13]
TANAKA S, 1974, P ICO C OPTICAL METH
[14]
FURTHER COMPUTER-SIMULATION STUDY OF IMAGE SPECKLE PATTERNS WITH RELATION TO OBJECT SURFACE PROFILE
UOZUMI, J
论文数:
0
引用数:
0
h-index:
0
机构:
HOKKAIDO UNIV,APPL ELECT RES INST,SAPPORO,HOKKAIDO 060,JAPAN
HOKKAIDO UNIV,APPL ELECT RES INST,SAPPORO,HOKKAIDO 060,JAPAN
UOZUMI, J
FUJII, H
论文数:
0
引用数:
0
h-index:
0
机构:
HOKKAIDO UNIV,APPL ELECT RES INST,SAPPORO,HOKKAIDO 060,JAPAN
HOKKAIDO UNIV,APPL ELECT RES INST,SAPPORO,HOKKAIDO 060,JAPAN
FUJII, H
ASAKURA, T
论文数:
0
引用数:
0
h-index:
0
机构:
HOKKAIDO UNIV,APPL ELECT RES INST,SAPPORO,HOKKAIDO 060,JAPAN
HOKKAIDO UNIV,APPL ELECT RES INST,SAPPORO,HOKKAIDO 060,JAPAN
ASAKURA, T
[J].
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA,
1977,
67
(06)
: 808
-
815
[15]
1976, J OPT SOC AM, V66
←
1
2
→
共 15 条
[11]
SURFACE-ROUGHNESS MEASUREMENT BY USING SPECKLE PATTERN
OHTSUBO, J
论文数:
0
引用数:
0
h-index:
0
机构:
HOKKAIDO UNIV,RES INST APPL ELECT,SAPPORO 060,HOKKAIDO,JAPAN
HOKKAIDO UNIV,RES INST APPL ELECT,SAPPORO 060,HOKKAIDO,JAPAN
OHTSUBO, J
FUJII, H
论文数:
0
引用数:
0
h-index:
0
机构:
HOKKAIDO UNIV,RES INST APPL ELECT,SAPPORO 060,HOKKAIDO,JAPAN
HOKKAIDO UNIV,RES INST APPL ELECT,SAPPORO 060,HOKKAIDO,JAPAN
FUJII, H
ASAKURA, T
论文数:
0
引用数:
0
h-index:
0
机构:
HOKKAIDO UNIV,RES INST APPL ELECT,SAPPORO 060,HOKKAIDO,JAPAN
HOKKAIDO UNIV,RES INST APPL ELECT,SAPPORO 060,HOKKAIDO,JAPAN
ASAKURA, T
[J].
JAPANESE JOURNAL OF APPLIED PHYSICS,
1975,
14
: 293
-
298
[12]
TANAKA S, 1975, JPN J APPL PHYS S, V14
[13]
TANAKA S, 1974, P ICO C OPTICAL METH
[14]
FURTHER COMPUTER-SIMULATION STUDY OF IMAGE SPECKLE PATTERNS WITH RELATION TO OBJECT SURFACE PROFILE
UOZUMI, J
论文数:
0
引用数:
0
h-index:
0
机构:
HOKKAIDO UNIV,APPL ELECT RES INST,SAPPORO,HOKKAIDO 060,JAPAN
HOKKAIDO UNIV,APPL ELECT RES INST,SAPPORO,HOKKAIDO 060,JAPAN
UOZUMI, J
FUJII, H
论文数:
0
引用数:
0
h-index:
0
机构:
HOKKAIDO UNIV,APPL ELECT RES INST,SAPPORO,HOKKAIDO 060,JAPAN
HOKKAIDO UNIV,APPL ELECT RES INST,SAPPORO,HOKKAIDO 060,JAPAN
FUJII, H
ASAKURA, T
论文数:
0
引用数:
0
h-index:
0
机构:
HOKKAIDO UNIV,APPL ELECT RES INST,SAPPORO,HOKKAIDO 060,JAPAN
HOKKAIDO UNIV,APPL ELECT RES INST,SAPPORO,HOKKAIDO 060,JAPAN
ASAKURA, T
[J].
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA,
1977,
67
(06)
: 808
-
815
[15]
1976, J OPT SOC AM, V66
←
1
2
→