FAR-INFRARED REFLECTION-ABSORPTION SPECTROSCOPY OF THIN POLYETHYLENE OXIDE-FILMS

被引：26

作者：

DACOSTA, VM ^{[1
]}

FISKE, TG ^{[1
]}

COLEMAN, LB ^{[1
]}

机构：

[1] UNIV CALIF DAVIS,DEPT PHYS,DAVIS,CA 95616

来源：

JOURNAL OF CHEMICAL PHYSICS | 1994年 / 101卷 / 04期

关键词：

D O I：

10.1063/1.467657

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

We report the temperature dependent far-infrared spectrum of ultra-thin films of polyethylene oxide (PEO). Using the orientational specificity of infrared and far-infrared reflection-absorption spectroscopy and in-situ recrystallization, we find that during spin coating the PEO helices are initially in the plane of the him, but on crystallization reorient to be normal to the substrate. A splitting of the C-O torsional mode near 109 cm(-1) is identified as arising from a distortion of the normal helical structure of PEO. Comparison with transmission spectra of cast films demonstrates the value of far-infrared reflection-absorption spectroscopy (FIRRAS) in the study of crystalline polymers in the far infrared.

引用

页码：2746 / 2751

页数：6

共 14 条

[1]

ANGOOD AC, 1968, J APPL PHYS, V19, P4985

[2]

Bailey F.E.J., 1976, POLYETHYLENE OXIDE

[3]

Billmeyer F. W., 1984, TXB POLYM SCI

[4] A DOUBLE POLARIZATION MODULATION FAR-INFRARED SPECTROMETER [J].