HRTEM CHARACTERIZATION OF HIGH-TC BI(PB)-BASED SUPERCONDUCTORS

被引：0
|
作者：
WU, XJ [1 ]
HORIUCHI, SG [1 ]
BENDOR, L [1 ]
DIAB, H [1 ]
机构：
[1] HEBREW UNIV JERUSALEM,IL-91904 JERUSALEM,ISRAEL
来源：
PHYSICA C | 1991年 / 185卷
关键词：
D O I：
10.1016/0921-4534(91)92113-P
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
Three Pb-doped Bi-based superconductors, Bi1.8Pbo.2Sr2Ca2Cu3Ox, which have almost the same critical temperature (Tc approximately 110K) with different magnetic susceptibility, are examined mainly by means of high-resolution transmission electron microscopy (HRTEM). Differences in microstructures are clearly detected.
引用
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页码：621 / 622
页数：2
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