HRTEM CHARACTERIZATION OF HIGH-TC BI(PB)-BASED SUPERCONDUCTORS

被引：0

作者：

WU, XJ ^{[1
]}

HORIUCHI, SG ^{[1
]}

BENDOR, L ^{[1
]}

DIAB, H ^{[1
]}

机构：

[1] HEBREW UNIV JERUSALEM,IL-91904 JERUSALEM,ISRAEL

来源：

PHYSICA C | 1991年 / 185卷

关键词：

D O I：

10.1016/0921-4534(91)92113-P

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Three Pb-doped Bi-based superconductors, Bi1.8Pbo.2Sr2Ca2Cu3Ox, which have almost the same critical temperature (Tc approximately 110K) with different magnetic susceptibility, are examined mainly by means of high-resolution transmission electron microscopy (HRTEM). Differences in microstructures are clearly detected.

引用

页码：621 / 622

页数：2