MULTIPLE-FAULT LOCATION OF ANALOG CIRCUITS

被引：34

作者：

BIERNACKI, RM

BANDLER, JW

机构：

[1] MCMASTER UNIV,DEPT ELECT & COMP ENGN,HAMILTON L8S 4L8,ONTARIO,CANADA

[2] MCMASTER UNIV,SIMULAT OPTIMIZAT & CONTROL GRP,HAMILTON L8S 4L8,ONTARIO,CANADA

来源：

IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS | 1981年 / 28卷 / 05期

关键词：

D O I：

10.1109/TCS.1981.1084998

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：361 / 367

页数：7

共 16 条

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[5] FAULT IDENTIFICATION IN ELECTRONIC CIRCUITS WITH AID OF BILINEAR TRANSFORMATIONS
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[6] MAYEDA W, 1978, 12TH P AS C CIRC SYS, P761
[7] FAILURE DIAGNOSIS USING QUADRATIC PROGRAMMING
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[8] THEORY AND AN ALGORITHM FOR ANALOG CIRCUIT FAULT DIAGNOSIS
NAVID, N
WILLSON, AN
[J]. IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS, 1979, 26 (07): : 440 - 457
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