SURFACE-MORPHOLOGY OF THE RUBBED POLYIMIDE AND POLYSTYRENE FILMS AND THEIR LIQUID-CRYSTAL ALIGNING CAPABILITY

被引:42
作者
SEO, DS
OHIDE, T
MATSUDA, H
ISOGAMI, TR
MUROI, KI
YABE, Y
KOBAYASHI, S
机构
[1] Division of Electronic and Information Engineering, Faculty of Technology, Tokyo University of Agriculture and Technology, Tokyo 184, 2-24-16 Nakamachi, Koganel
[2] Production Technology Research Center, Ricoh Co. Ltd, Atsugi
来源
MOLECULAR CRYSTALS AND LIQUID CRYSTALS | 1993年 / 231卷
关键词
POLYIMIDE (PI) FILMS; POLYSTYRENE (PS) FILMS; RUBBING STRENGTH (RS); OPTICAL RETARDATION; PRETILT ANGLE; SURFACE MORPHOLOGY; ATOMIC FORCE MICROSCOPE (AFM); NEMATIC LIQUID CRYSTAL (NLC);
D O I
10.1080/10587259308032496
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
Atomic force microscope (AFM) observation has been made on rubbed polymer films for liquid crystal (LC) molecular orientation such as those of alkylbranched and branchless polyimide (PI) together with polystyrene (PS); other characterizations such as Fourier analysis and roughness evaluation have also been made. It has been investigated how these results of the characterization relate to the LC aligning capabilities such as microscopic texture and pretilt angle. It is shown that in a PI film with alkylbranches there exist grooves owing to strong rubbing. while the branchless does not reveal grooves at the AFM resolution. However, both of them are shown to be capable of aligning nematic (N) LCs very well. Regarding PS film, the grooves run parallel to the rubbing direction but LC alignment is perpendicular to that of rubbing, in accordance with the previous report (D.-S. Seo et al., Jpn. J. Appl. Phys. 31, 2165C 1992)).
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页码:95 / 106
页数:12
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