EFFECTS OF GROWTH-PARAMETERS ON OXYGEN INCORPORATION INTO INGAALP GROWN BY METALORGANIC CHEMICAL VAPOR-DEPOSITION

被引:21
作者
NISHIKAWA, Y
SUZUKI, M
OKAJIMA, M
机构
[1] Research and Development Center, Toshiba Corporation, Saiwaiku, 210
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1993年 / 32卷 / 1B期
关键词
INGAAIP ALLOY; OXYGEN INCORPORATION; METALORGANIC CHEMICAL VAPOR DEPOSITION; GROWTH PARAMETER; ACCEPTOR COMPENSATION; IMPURITY; ZN DOPING;
D O I
10.1143/JJAP.32.498
中图分类号
O59 [应用物理学];
学科分类号
摘要
Oxygen incorporation into In0.5(Ga1-xAlx)0.5P grown by metalorganic chemical vapor deposition has been quantitatively investigated as a function of growth parameters. The oxygen concentration (No) increased with increasing Al composition (x). Marked decreases in N(O) for x = 0.7 and 1.0 were observed as the V/III ratio (molar flow rate ratio of group-V to group-III sources) was increased, although N(O) for x = 0.7 was almost independent of the substrate temperature (T(S)). Since No for x = 1.0 was strongly affected by the amount of oxygen-containing species in trimethylaluminum (TMA), the origin of oxygen in InGaAlP is thought to be TMA. Net acceptor concentration (NA-ND) in Zn-doped InGaAlP for x = 0.7 and 1.0 decreased with increasing N(O). Oxygen may act as a deep donor, compensating for Zn acceptors.
引用
收藏
页码:498 / 501
页数:4
相关论文
共 15 条
  • [1] ENERGY-LEVEL MODEL FOR HIGH-RESISTIVITY GALLIUM ARSENIDE
    BLANC, J
    WEISBERG, LR
    [J]. NATURE, 1961, 192 (479) : 155 - &
  • [2] INVESTIGATION OF HETEROJUNCTIONS FOR MIS DEVICES WITH OXYGEN-DOPED ALXGA1-XAS ON N-TYPE GAAS
    CASEY, HC
    CHO, AY
    LANG, DV
    NICOLLIAN, EH
    FOY, PW
    [J]. JOURNAL OF APPLIED PHYSICS, 1979, 50 (05) : 3484 - 3491
  • [3] SELENIUM AND ZINC DOPING IN GA0.5IN0.5P AND (AL0.5GA0.5)0.5IN0.5P GROWN BY METALORGANIC CHEMICAL VAPOR-DEPOSITION
    IKEDA, M
    KANEKO, K
    [J]. JOURNAL OF APPLIED PHYSICS, 1989, 66 (11) : 5285 - 5289
  • [4] ISHIKAWA M, 1990, I PHYS C SER, V106, P575
  • [5] KUECH TF, 1992, J ELECTRON MATER, V21, P343
  • [6] KUECH TF, 1984, I PHYS C SER, V74, P181
  • [7] THE EFFECT OF OXYGEN INCORPORATION IN SEMIINSULATING (ALXGA1-X)YIN1-YP
    MCCALMONT, JS
    CASEY, HC
    WANG, TY
    STRINGFELLOW, GB
    [J]. JOURNAL OF APPLIED PHYSICS, 1992, 71 (02) : 1046 - 1048
  • [8] MIRCEA A, 1977, PHYS REV B, V16, P3655
  • [9] PHOTOLUMINESCENCE STUDIES ON INGAALP LAYERS GROWN BY LOW-PRESSURE METALORGANIC CHEMICAL VAPOR-DEPOSITION
    NARITSUKA, S
    NISHIKAWA, Y
    SUGAWARA, H
    ISHIKAWA, M
    KOKUBUN, Y
    [J]. JOURNAL OF ELECTRONIC MATERIALS, 1991, 20 (09) : 687 - 690
  • [10] EFFECTS OF V III RATIO ON ZN ELECTRICAL-ACTIVITY IN ZN-DOPED INGAALP GROWN BY METALORGANIC CHEMICAL VAPOR-DEPOSITION
    NISHIKAWA, Y
    SUGAWARA, H
    ISHIKAWA, M
    KOKUBUN, Y
    [J]. JOURNAL OF CRYSTAL GROWTH, 1991, 108 (3-4) : 728 - 732