THE IBM COMPUTER - STEM SYSTEM

被引：16
作者：
BATSON, PE
TRAFAS, G
机构：
来源：
ULTRAMICROSCOPY | 1982年 / 8卷 / 03期
关键词：
D O I：
10.1016/0304-3991(82)90246-7
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
引用
收藏
页码：293 / 300
页数：8
相关论文
共 7 条
[1]   DIGITAL DATA ACQUISITION OF ELECTRON-ENERGY LOSS INTENSITIES [J].
BATSON, PE .
ULTRAMICROSCOPY, 1978, 3 (04) :367-371
[2]  
BATSON PE, 1971, 29TH P ANN M EL MICR, P30
[3]  
BATSON PE, 1978, 9TH P INT C EL MICR, V1, P562
[4]   SLOW SCAN DISPLAY SYSTEM FOR A SCANNING ELECTRON-MICROSCOPE [J].
BECK, V .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1973, 44 (08) :1064-1066
[5]  
EGERTON RF, 1980, 38TH ANN P EMSA, P130
[6]   SCANNING ELECTRON-DIFFRACTION STUDY OF VAPOR-DEPOSITED AND ION-IMPLANTED THIN-FILMS OF GE (I) [J].
GRACZYK, JF ;
CHAUDHARI, P .
PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS, 1973, 58 (01) :163-179
[7]  
JONES AV, 1980, SCANNING ELECTRON MI, V1, P113
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