INVESTIGATION OF THE (001) CLEAVAGE PLANE OF POTASSIUM-BROMIDE WITH AN ATOMIC FORCE MICROSCOPE AT 4.2-K IN ULTRA-HIGH VACUUM

被引：82
作者：
GIESSIBL, FJ
BINNIG, G
机构：
[1] Physics Group Munich, IBM Research Division, clo Universität München, W-8000 München 40
来源：
ULTRAMICROSCOPY | 1992年 / 42卷
关键词：
D O I：
10.1016/0304-3991(92)90280-W
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
We have imaged the (001) surface of KBr with a UHV atomic force microscope at 4.2 K and 300 K. The sample was prepared by cleaving it in UHV along the (001) plane. We achieved atomic resolution at 4.2 K and resolved both the potassium and the bromium ions. We show atomically resolved images of flat terraces as large as 25 nm by 25 nm. Force-versus-distance measurements were taken, and the influence of the loading force acting between sample and cantilever on the appearance of friction effects and sample damage was studied.
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页码：281 / 289
页数：9
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