ESTIMATION OF THIN-OXIDE RELIABILITY USING PROPORTIONAL HAZARDS MODELS

被引：28

作者：

ELSAYED, EA ^{[1
]}

CHAN, CK ^{[1
]}

机构：

[1] AT&T BELL LABS,WHIPPANY,NJ 07981

来源：

IEEE TRANSACTIONS ON RELIABILITY | 1990年 / 39卷 / 03期

关键词：

D O I：

10.1109/24.103013

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

Proportional hazards models for estimating thin-oxide dielectric reliability and time-dependent dielectric-breakdown hazard rates are developed. Two groups of models are considered: group one ignores interactions between temperature and electric field, while group two considers several forms of interactions. The inclusion of interaction is not statistically significant at the 1% level. An analysis of the Hokari time-dependent dielectric-breakdown data, in terms of the form of the electric-field acceleration factor, shows that approach of I. C. Chen et al. (1985) is more appropriate than the approach of D. L. Crook (1979).

引用

页码：329 / 335

页数：7

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