STRUCTURAL INTEGRITY OF CERAMIC MULTILAYER CAPACITOR MATERIALS AND CERAMIC MULTILAYER CAPACITORS

被引:41
作者
DEWITH, G [1 ]
机构
[1] EINDHOVEN UNIV TECHNOL,CTR TECH CERAM,5600 MD EINDHOVEN,NETHERLANDS
关键词
D O I
10.1016/0955-2219(93)90001-8
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
An overview is given of the fracture of and stress situation in ceramic, capacitor materials and ceramic multilayer capacitors. A brief introduction to the relevant concepts is given first. Next the data for capacitor materials and the data for capacitors are discussed. It is shown that the materials data are not directly transferable to the components. A wide variability of component properties exist, dependent on all microstructural features. Details on the microstructure itself are generally lacking. It is concluded that the effect and amount of subcritical crack growth and residual stress in the ceramic and of relaxation of the metal parts on the mechanical behaviour of capacitors is insufficiently known for reliable longevity predictions.
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页码:323 / 336
页数:14
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