DICHROMETER FOR STUDYING FREE-CARRIER DENSITY IN SEMICONDUCTORS

被引：0

作者：

POTIKHONOV, GN

GALANOV, EK

LEIKIN, MV

KOSTROV, ID

机构：

来源：

SOVIET JOURNAL OF OPTICAL TECHNOLOGY | 1981年 / 48卷 / 02期

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D O I：

暂无

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：80 / 81

页数：2

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