PENETRATION DEPTH OF SUPERCONDUCTING FILMS MEASURED WITH NB-NBOX-PBIN JOSEPHSON JUNCTIONS

被引:6
作者
DETTMANN, F
REXHAUSER, R
机构
[1] Sektion Physik Der, Friedrich-Schiller-Universitat Jena
来源
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1979年 / 51卷 / 01期
关键词
D O I
10.1002/pssa.2210510121
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
NbNbOx–PbIn junctions are investigated, especially in view of aging. The penetration depths λ(0) of the niobium films are equal for critical temperatures between 8.1 and 8.6 K. The properties of the niobium films do not change with time. The penetration depth, the critical temperature, and the residual resistance ratio of the PbIn films produced by first evaporation of lead and after that of indium change with time. The tunneling resistance of the NbNbOx–PbIn junctions decreases by a factor of 3 to 4 in the course of more than two years. Copyright © 1979 WILEY‐VCH Verlag GmbH & Co. KGaA
引用
收藏
页码:197 / 200
页数:4
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