共 50 条
[41]
CHARACTERIZATION OF CATALYSTS BY SCANNING-TRANSMISSION ELECTRON-MICROSCOPY
[J].
ACS SYMPOSIUM SERIES,
1989, 411
:342-353
[42]
ELECTRON-MICROSCOPY OF OLIVINE WITH PERFECT CLEAVAGE
[J].
PROCEEDINGS OF THE INDIAN ACADEMY OF SCIENCES-EARTH AND PLANETARY SCIENCES,
1983, 92 (03)
:283-295
[44]
Characterization of Dislocation Structures in Hexagonal SiC by Transmission Electron Microscopy
[J].
DEFECTS-RECOGNITION, IMAGING AND PHYSICS IN SEMICONDUCTORS XIV,
2012, 725
:11-+
[48]
CALCIUM ALGINATE ENCAPSULATION OF SMALL SPECIMENS FOR TRANSMISSION ELECTRON-MICROSCOPY
[J].
JOURNAL OF MICROSCOPY-OXFORD,
1994, 175
:166-170
[50]
TRANSMISSION ELECTRON-MICROSCOPY EVIDENCE FOR DISLOCATION DISSOCIATION AND STACKING-FAULTS IN NIOBIUM
[J].
SCRIPTA METALLURGICA,
1975, 9 (04)
:349-356