MICROFABRICATED SCANNING TUNNELING MICROSCOPE

被引：44
|
作者：
AKAMINE, S
ALBRECHT, TR
ZDEBLICK, MJ
QUATE, CF
机构：
来源：
IEEE ELECTRON DEVICE LETTERS | 1989年 / 10卷 / 11期
关键词：
D O I：
10.1109/55.43113
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：490 / 492
页数：3
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