MICROFABRICATED SCANNING TUNNELING MICROSCOPE

被引：44

作者：

AKAMINE, S

ALBRECHT, TR

ZDEBLICK, MJ

QUATE, CF

机构：

来源：

IEEE ELECTRON DEVICE LETTERS | 1989年 / 10卷 / 11期

关键词：

D O I：

10.1109/55.43113

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：490 / 492

页数：3

共 9 条

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[7] SCANNING TUNNELING MICROSCOPE [J].

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[8]

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[9] PHYSICAL-PROPERTIES OF THIN-FILM FIELD-EMISSION CATHODES WITH MOLYBDENUM CONES [J].

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