MICROWAVE PROPERTIES OF YBCO THIN-FILMS

被引:23
作者
AVENHAUS, B
PORCH, A
LANCASTER, MJ
HENSEN, S
LENKENS, M
ORBACHWERBIG, S
MULLER, G
DAHNE, U
TELLMANN, N
KLEIN, N
DUBOURDIEU, C
SENATEUR, JP
THOMAS, O
KARL, H
STRITZKER, B
EDWARDS, JA
HUMPHREYS, R
机构
[1] BERG UNIV GESAMTHSCH WUPPERTAL, FACHBEREICH PHYS, D-42097 WUPPERTAL, GERMANY
[2] FORSCHUNGSZENTRUM JULICH, FORSCHUNGSZENTRUM, INST FESTKORPERFORSCH, IMF, D-52425 JULICH, GERMANY
[3] CNRS GRENOBLE, LMGP, F-38402 ST MARTIN DHERES, FRANCE
[4] UNIV AUGSBURG, INST PHYS, D-86135 AUGSBURG, GERMANY
[5] DEF RES ESTAB, MALVERN WR14 3PS, WORCS, ENGLAND
关键词
D O I
10.1109/77.402913
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We have measured the microwave properties of high quality YBCO thin films using a copper cavity (87GHz) and a dielectric resonator (19GHz) for unpatterned films as well as a coplanar resonator (5, 8, 10, 15 and 16GHz) for patterned films. For the patterned films the surface resistance (R(s)) and non-linear effects were studied as a function of temperature below T-c. For practical applications, the assessment of non-linear effects in the surface resistance are of great importance. The best films showed R(s) approximately constant up to microwave peak current densities of the order of the dc critical current density. The measurements were performed on samples fabricated by a number of different techniques.
引用
收藏
页码:1737 / 1740
页数:4
相关论文
共 12 条
[1]   MICROWAVE DETERMINATION OF THE QUASI-PARTICLE SCATTERING TIME IN YBA2CU3O6.95 [J].
BONN, DA ;
LIANG, RX ;
RISEMAN, TM ;
BAAR, DJ ;
MORGAN, DC ;
ZHANG, K ;
DOSANJH, P ;
DUTY, TL ;
MACFARLANE, A ;
MORRIS, GD ;
BREWER, JH ;
HARDY, WN ;
KALLIN, C ;
BERLINSKY, AJ .
PHYSICAL REVIEW B, 1993, 47 (17) :11314-11328
[2]  
CHEW NG, 1995, IEEE T APPL SUPERCON, V5, P2075
[3]  
HENSEN S, 1993, P EUCAS, P1053
[4]   PHYSICAL VAPOR-DEPOSITION TECHNIQUES FOR THE GROWTH OF YBA2CU3O7 THIN-FILMS [J].
HUMPHREYS, RG ;
SATCHELL, JS ;
CHEW, NG ;
EDWARDS, JA ;
GOODYEAR, SW ;
BLENKINSOP, SE ;
DOSSER, OD ;
CULLIS, AG .
SUPERCONDUCTOR SCIENCE & TECHNOLOGY, 1990, 3 (01) :38-52
[5]  
HUNDNER, 1993, J APPL PHYS, V74, P4631
[6]   MICROWAVE SURFACE-RESISTANCE OF EPITAXIAL YBA2CU3O7 THIN-FILMS AT 18.7 GHZ MEASURED BY A DIELECTRIC RESONATOR TECHNIQUE [J].
KLEIN, N ;
DAHNE, U ;
POPPE, U ;
TELLMANN, N ;
URBAN, K ;
ORBACH, S ;
HENSEN, S ;
MULLER, G ;
PIEL, H .
JOURNAL OF SUPERCONDUCTIVITY, 1992, 5 (02) :195-201
[7]  
KLEIN N, 1993, IEEE APPL SUPERCOND, V3
[8]   PREPARATION AND NONDESTRUCTIVE CHARACTERIZATION OF YBA2CU3O7-DELTA FILMS FOR MICROWAVE APPLICATIONS [J].
LENKENS, M ;
ASCHERMANN, B ;
HENSEN, S ;
JECK, M ;
ORBACH, S ;
SCHLICK, H ;
CHALOUPKA, H ;
MULLER, G ;
PIEL, H .
JOURNAL OF ALLOYS AND COMPOUNDS, 1993, 195 (1-2) :559-562
[9]   STRIPLINE RESONATOR MEASUREMENTS OF ZS VERSUS HRF IN YBA2CU3O7-X THIN-FILMS [J].
OATES, DE ;
ANDERSON, AC ;
SHEEN, DM ;
ALI, SM .
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1991, 39 (09) :1522-1529
[10]   LOW-RESISTIVITY EPITAXIAL YBA2CU3O7 THIN-FILMS WITH IMPROVED MICROSTRUCTURE AND REDUCED MICROWAVE LOSSES [J].
POPPE, U ;
KLEIN, N ;
DAHNE, U ;
SOLTNER, H ;
JIA, CL ;
KABIUS, B ;
URBAN, K ;
LUBIG, A ;
SCHMIDT, K ;
HENSEN, S ;
ORBACH, S ;
MULLER, G ;
PIEL, H .
JOURNAL OF APPLIED PHYSICS, 1992, 71 (11) :5572-5578