PACKAGING OF PRINTED-CIRCUIT LINES - A DANGEROUS CAUSE FOR NARROW PULSE DISTORTION

被引:14
作者
TSUJI, M
SHIGESAWA, H
机构
[1] Department of Electronics, Doshisha University, Tanabe, Kyoto
关键词
D O I
10.1109/22.310588
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We report here a new behavioral feature of a narrow pulse transmitted on coplanar waveguide (CPW), putting the special stress on the effects caused by the packaging of such a waveguide. This feature occurs due to the unexpected simultaneous combination of a distortion in the guided main pulse and a production of delayed echo pulses. An explanation based on a new class of the dominant-mode power-leakage effect leads to a clear physical understanding of why such features necessarily appear.
引用
收藏
页码:1784 / 1790
页数:7
相关论文
共 15 条
  • [1] AUSTON DH, 1988, ULTRASHORT LASER PUL
  • [2] DRAGOMAN M, 1993, ULTRA WIDEBAND SHORT
  • [3] EXPERIMENTS ON KDV SOLITONS
    JAGER, D
    [J]. JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, 1982, 51 (05) : 1686 - 1693
  • [4] PICOSECOND OPTICS AND MICROWAVE TECHNOLOGY
    LEE, CH
    [J]. IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1990, 38 (05) : 596 - 607
  • [5] NGHIEM D, 1991, JUN IEEE INT MICR S, P567
  • [6] GAAS NONLINEAR TRANSMISSION-LINES FOR PICOSECOND PULSE GENERATION AND MILLIMETER-WAVE SAMPLING
    RODWELL, MJW
    KAMEGAWA, M
    YU, R
    CASE, M
    CARMAN, E
    GIBONEY, KS
    [J]. IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1991, 39 (07) : 1194 - 1204
  • [7] 500 GHZ GAAS MMIC SAMPLING WAFER PROBE
    SHAKOURI, MS
    BLACK, A
    AULD, BA
    BLOOM, DM
    [J]. ELECTRONICS LETTERS, 1993, 29 (06) : 557 - 558
  • [8] SHIGESAWA H, 1993, 23RD P EUR MICR C MA
  • [9] SHIGESAWA H, 1991, T IEICE JAPAN E, V74, P1264
  • [10] NEW INTERESTING LEAKAGE BEHAVIOR ON COPLANAR WAVE-GUIDES OF FINITE AND INFINITE WIDTHS
    TSUJI, M
    SHIGESAWA, H
    OLINER, AA
    [J]. IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1991, 39 (12) : 2130 - 2137