THEORY AND APPLICATIONS OF THE WHITE-LIGHT SPECKLE METHOD FOR STRAIN ANALYSIS

被引：51

作者：

ASUNDI, A ^{[1
]}

CHIANG, FP ^{[1
]}

机构：

[1] SUNY STONY BROOK, DEPT MECH ENGN, STONY BROOK, NY 11794 USA

来源：

关键词：

Compendex;

D O I：

10.1117/12.7972953

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

STRAIN

引用

页码：570 / 580

页数：11

共 25 条

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[4] ASUNDI A, 1981, SUNY388 COLL ENG APP
[5] BOONE PM, 1976, OPTIK, V44, P343
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BURCH, JM
FORNO, C
[J]. OPTICAL ENGINEERING, 1975, 14 (02) : 178 - 185
[7] BURCH JM, 1972, OPT ACTA, V19, P253
[8] WHITE-LIGHT SPECKLE METHOD WITH TANDEM PLATES FOR 3-D DISPLACEMENT AND DEFORMATION MEASUREMENT ON CURVED SURFACES
CHIANG, FP
ASUNDI, A
[J]. APPLIED OPTICS, 1981, 20 (13): : 2167 - 2169
[9] A WHITE-LIGHT SPECKLE METHOD APPLIED TO THE DETERMINATION OF STRESS INTENSITY FACTOR AND DISPLACEMENT FIELD AROUND A CRACK TIP
CHIANG, FP
ASUNDI, A
[J]. ENGINEERING FRACTURE MECHANICS, 1981, 15 (1-2) : 115 - 121
[10] WHITE-LIGHT SPECKLE METHOD OF EXPERIMENTAL STRAIN ANALYSIS
CHIANG, FP
ASUNDI, A
[J]. APPLIED OPTICS, 1979, 18 (04): : 409 - 411