ELECTRON BACKSCATTERING PATTERNS - NEW TECHNIQUE FOR OBTAINING CRYSTALLOGRAPHIC INFORMATION IN SCANNING ELECTRON-MICROSCOPE

被引：351

作者：

VENABLES, JA ^{[1
]}

HARLAND, CJ ^{[1
]}

机构：

[1] UNIV SUSSEX,SCH MATH & PHYS SCI,BRIGHTON BN1 9QH,SUSSEX,ENGLAND

来源：

PHILOSOPHICAL MAGAZINE | 1973年 / 27卷 / 05期

关键词：

D O I：

10.1080/14786437308225827

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：1193 / 1200

页数：8

共 11 条

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[4]

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[5]

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[6] SCANNING ELECTRON-MICROSCOPE SELECTED AREA CHANNELING PATTERNS FROM 1 MICRON SPECIMEN AREAS [J].

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NEWBURY, DE .

JOURNAL OF MATERIALS SCIENCE, 1972, 7 (06) :714-&

[7] SIMULTANEOUS DISPLAY OF MICROGRAPH AND SELECTED-AREA CHANNELLING PATTERN USING SCANNING ELECTRON MICROSCOPE [J].

JOY, DC ;

BOOKER, GR .

JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1971, 4 (11) :837-&

[8]

JOY DC, 1971, SCANNING ELECTRON MI

[9] OPTIMUM CONDITIONS FOR GENERATING CHANNELLING PATTERNS IN SCANNING ELECTRON MICROSCOPE [J].

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[10]

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