Complex dielectric function of CdTe/GaAs thin films studied by spectroscopic ellipsometry

被引：0

作者：

Jeen, Gwangsoo ^{[1
]}

Jo, Jaehyuk ^{[1
]}

Park, Hyoyeol ^{[2
]}

机构：

[1] Busan Natl Univ, Dept Phys, Busan 680749, South Korea

[2] Ulsan Coll, Dept Semicond Applicat, Ulsan 680749, South Korea

来源：

JOURNAL OF THE KOREAN CRYSTAL GROWTH AND CRYSTAL TECHNOLOGY | 2005年 / 15卷 / 04期

关键词：

CdTe thin film; Spectroscopic ellipsomerty; Dielectric function;

D O I：

暂无

中图分类号：

O7 [晶体学];

学科分类号：

0702 ; 070205 ; 0703 ; 080501 ;

摘要：

Spectroscopic ellipsomerty measurements of the complex dielectric function of the CdTe thin films grown on GaAs(100) substrates by hot wall epitaxy have been performed in 1.5-5.5 eV photon energy range at room temperature. The spectroscopic ellipsometer spectra revealed distinct structures at energies of the E-1,E-1 + Delta(1)and E-2 critical points. These energies were decreased with increasing thickness of CdTe thin films.

引用

页码：157 / 161

页数：5

共 50 条

[21] MODELING THE DIELECTRIC FUNCTION OF THIN-FILMS MEASURED BY SPECTROSCOPIC ELLIPSOMETRY - DETERMINATION OF MICROSTRUCTURE AND DENSITY
HAAGE, T
SCHMIDT, UI
SCHRODER, B
OECHSNER, H
FRESENIUS JOURNAL OF ANALYTICAL CHEMISTRY, 1995, 353 (5-8): : 556 - 558
[22] Thin films with high surface roughness: thickness and dielectric function analysis using spectroscopic ellipsometry
Lehmann, Daniel
Seidel, Falko
Zahn, Dietrich R. T.
SPRINGERPLUS, 2014, 3 : 1 - 8
[23] Thermal behaviour of chitosan and chitin thin films studied by spectroscopic ellipsometry
Montiel-Gonzalez, Z.
Luna-Barcenas, G.
Mendoza-Galvan, A.
PHYSICA STATUS SOLIDI C - CURRENT TOPICS IN SOLID STATE PHYSICS, VOL 5, NO 5, 2008, 5 (05): : 1434 - 1437
[24] Air pockets in thin porous platinum films studied by spectroscopic ellipsometry
Linkoping Univ, Linkoping, Sweden
Thin Solid Films, 1-2 (179-184):
[25] Identification of electrically active defects in thin dielectric films by spectroscopic ellipsometry
Price, J.
Bersuker, G.
Lysaght, P. S.
JOURNAL OF APPLIED PHYSICS, 2012, 111 (04)
[26] THIN-FILMS OF PHTHALOCYANINES STUDIED WITH SPECTROSCOPIC ELLIPSOMETRY - AN OPTICAL GAS SENSOR
MARTENSSON, J
ARWIN, H
LUNDSTROM, I
SENSORS AND ACTUATORS B-CHEMICAL, 1990, 1 (1-6) : 134 - 137
[27] Spectroscopic ellipsometry study of the influence of indium ion implantation on dielectric function of GaAs
Kulik, Miroslaw
Rzodkiewicz, Witold
Zuk, Jerzy
Komarov, Fadei. F.
PRZEGLAD ELEKTROTECHNICZNY, 2008, 84 (03): : 196 - 199
[28] Thermal Dependence of Optical Properties of Silver Thin Films Studied By Spectroscopic Ellipsometry
Sundari, S. Tripura
Dash, S.
Tyagi, A. K.
SOLID STATE PHYSICS, PTS 1 AND 2, 2012, 1447 : 673 - 674
[29] THIN-FILMS OF POLY(3-HEXYLTHIOPHENE) STUDIED WITH SPECTROSCOPIC ELLIPSOMETRY
JANSSON, R
ARWIN, H
GUSTAFSSON, G
INGANAS, O
SYNTHETIC METALS, 1989, 28 (1-2) : C371 - C376
[30] Vapor adsorption in thin silicalite-1 films studied by spectroscopic ellipsometry
Bjorklund, RB
Hedlund, J
Sterte, J
Arwin, H
JOURNAL OF PHYSICAL CHEMISTRY B, 1998, 102 (12): : 2245 - 2250

← 1 2 3 4 5 →