PREPARATION AND CHARACTERIZATION OF THIN FEF3 FILMS

被引：16

作者：

LACHTER, A

LASCAUD, M

BARRIERE, AS

LOZANO, L

PORTIER, J

SABOYA, B

机构：

[1] UNIV BORDEAUX 1,CNRS,CHIM SOLIDE LAB,F-33405 TALENCE,FRANCE

[2] UNIV BORDEAUX 1,CEN BORDEAUX GRADIGNAN,F-33405 TALENCE,FRANCE

来源：

JOURNAL OF CRYSTAL GROWTH | 1978年 / 43卷 / 05期

关键词：

D O I：

10.1016/0022-0248(78)90051-9

中图分类号：

O7 [晶体学];

学科分类号：

0702 ; 070205 ; 0703 ; 080501 ;

摘要：

引用

页码：621 / 627

页数：7

共 11 条

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[3]

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[4]

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[5]

LASCAUD M, UNPUBLISHED

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PHYSICAL REVIEW, 1960, 120 (01) :91-98

[8] SIMULTANEOUS OBSERVATION OF RUTHERFORD SCATTERING AND (ALPHA,X) REACTIONS IN ALF3 AND MGF2 LAYERS AND CORRELATION WITH THEIR ELECTRICAL PROPERTIES [J].

SABOYA, B ;

CHEMIN, JF ;

ROTURIER, J ;

BARRIERE, A ;

DANTO, Y ;

SALARDENNE, J .

JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1975, 8 (09) :1008-1020

[9]

SABOYA B, 1973, THESIS U BORDEAUX 1

[10] SUBLATTICE MAGNETIZATION IN FEF3 NEAR NEEL POINT [J].

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SOLID STATE COMMUNICATIONS, 1967, 5 (07) :537-+

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