DEFLECTION SYSTEM FOR ADJUSTMENT AND SCANNING OF ELECTRON-BEAMS

被引：0
作者：
RYBAKOV, YL
VASICHEV, BN
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INSTRUMENTS AND EXPERIMENTAL TECHNIQUES | 1977年 / 20卷 / 05期
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T [工业技术];
学科分类号：
08 ;
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页码：1459 / 1462
页数：4
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