3-CRYSTAL X-RAY SCAN SIMULATION OF SUPERLATTICE STRUCTURES USING ABELES TAKAGI DYNAMIC APPROACH

被引：0

作者：

SHRIVASTAVA, MC

SWAMINATHAN, S

机构：

来源：

ELECTRONICS LETTERS | 1989年 / 25卷 / 14期

关键词：

D O I：

10.1049/el:19890626

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：933 / 934

页数：2

共 8 条

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[8] HIGH-RESOLUTION X-RAY-DIFFRACTION STUDIES OF INGAAS(P)/INP SUPERLATTICES GROWN BY GAS-SOURCE MOLECULAR-BEAM EPITAXY [J].

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