PRE-SPECTROMETER OPTICS IN A CTEM-STEM

被引：18
作者：
JOHNSON, DE
机构：
来源：
ULTRAMICROSCOPY | 1980年 / 5卷 / 02期
关键词：
D O I：
10.1016/0304-3991(80)90022-4
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
引用
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页码：163 / 174
页数：12
相关论文
共 13 条
[1]  
CREWE AV, 1977, OPTIK, V47, P299
[2]   SIMPLE ELECTRON SPECTROMETER FOR ENERGY ANALYSIS IN TRANSMISSION MICROSCOPE [J].
EGERTON, RF .
ULTRAMICROSCOPY, 1978, 3 (01) :39-47
[3]  
EGERTON RF, SCANNING ELECTRON MI
[4]  
FERT C, 1967, FOCUSING CHARGED PAR, V1, P309
[5]  
HAINE ME, 1961, ELECTRON MICROSCOPE
[6]   MICROANALYSIS OF LIGHT-ELEMENTS USING TRANSMITTED ENERGY-LOSS ELECTRONS [J].
ISAACSON, M ;
JOHNSON, D .
ULTRAMICROSCOPY, 1975, 1 (01) :33-52
[7]   ELECTRON MICROSPECTROSCOPY [J].
ISAACSON, MS ;
CREWE, AV .
ANNUAL REVIEW OF BIOPHYSICS AND BIOENGINEERING, 1975, 4 :165-184
[8]   BASIC ASPECTS OF ENERGY-LOSS SPECTROMETER SYSTEMS [J].
JOHNSON, DE .
ULTRAMICROSCOPY, 1978, 3 (04) :361-365
[9]  
JOHNSON DE, REV SCI INSTR
[10]  
JOHNSON DE, SCANNING ELECTRON MI
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