HIGH-RESOLUTION X-RAY-DIFFRACTION STUDIES OF MULTILAYERS

被引：3
|
作者：
CHRISTENSEN, FE [1 ]
HORNSTRUP, A [1 ]
SCHNOPPER, HW [1 ]
机构：
[1] TECH UNIV DENMARK,APPL PHYS LAB 3,DK-2800 LYNGBY,DENMARK
来源：
JOURNAL OF APPLIED CRYSTALLOGRAPHY | 1988年 / 21卷
关键词：
D O I：
10.1107/S0021889888001177
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
引用
收藏
页码：252 / 257
页数：6
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