HIGH-RESOLUTION X-RAY-DIFFRACTION STUDIES OF MULTILAYERS

被引：3

作者：

CHRISTENSEN, FE ^{[1
]}

HORNSTRUP, A ^{[1
]}

SCHNOPPER, HW ^{[1
]}

机构：

[1] TECH UNIV DENMARK,APPL PHYS LAB 3,DK-2800 LYNGBY,DENMARK

来源：

JOURNAL OF APPLIED CRYSTALLOGRAPHY | 1988年 / 21卷

关键词：

D O I：

10.1107/S0021889888001177

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

引用

页码：252 / 257

页数：6

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