DEPTH-SELECTIVE CONVERSION-ELECTRON MOSSBAUER-SPECTROSCOPY

被引:35
作者
SHIGEMATSU, T
PFANNES, HD
KEUNE, W
机构
关键词
D O I
10.1103/PhysRevLett.45.1206
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
引用
收藏
页码:1206 / 1209
页数:4
相关论文
共 16 条
[1]   DEPTH SELECTIVE MOSSBAUER-EFFECT MEASUREMENTS BY MEANS OF SCATTERED ELECTRONS [J].
BAVERSTA.U ;
EKDAHL, T ;
BOHM, C ;
RINGSTRO.B ;
STEFANSS.V ;
LILJEQUI.D .
NUCLEAR INSTRUMENTS & METHODS, 1974, 115 (02) :373-380
[2]   ELECTROSTATIC SPECTROMETER FOR CONVERSION ELECTRON MOSSBAUER-SPECTROSCOPY [J].
BAVERSTAM, U ;
BODLUNDRINGSTROM, B ;
BOHM, C ;
EKDAHL, T ;
LILJEQUIST, D .
NUCLEAR INSTRUMENTS & METHODS, 1978, 154 (02) :401-403
[3]   SIMPLE METHOD FOR ANALYSIS OF DEPTH-SELECTIVE MOSSBAUER-EFFECT MEASUREMENTS [J].
BAVERSTAM, U ;
EKDAHL, T ;
BOHM, C ;
LILJEQUIST, D ;
RINGSTROM, B .
NUCLEAR INSTRUMENTS & METHODS, 1974, 118 (01) :313-316
[4]  
BENCZERKOLLER N, 1977, 1977 WORKSH NEW DIR, V38, P107
[5]   METHOD OF ANALYSIS OF THIN SURFACE LAYERS BY MOSSBAUER EFFECT [J].
BONCHEV, Z ;
JORDANOV, A ;
MINKOVA, A .
NUCLEAR INSTRUMENTS & METHODS, 1969, 70 (01) :36-&
[6]  
DOMKE M, 5TH P INT C HYP INT
[7]  
Ibach H., 1977, Electron spectroscopy for surface analysis, P1
[8]   ANALYSIS OF BACKSCATTER MOSSBAUER-SPECTRA OBTAINED WITH INTERNAL-CONVERSION ELECTRONS [J].
KRAKOWSKI, RA ;
MILLER, RB .
NUCLEAR INSTRUMENTS & METHODS, 1972, 100 (01) :93-+
[9]   ANALYSIS OF ELECTRON-TRANSPORT IN CONVERSION ELECTRON MOSSBAUER-SPECTROSCOPY (CEMS) [J].
LILJEQUIST, D ;
EKDAHL, T ;
BAVERSTAM, U .
NUCLEAR INSTRUMENTS & METHODS, 1978, 155 (03) :529-538
[10]   INTERPRETATION AND PRACTICAL ANALYSIS OF DEPTH SELECTIVE CONVERSION ELECTRON MOSSBAUER-SPECTRA [J].
LILJEQUIST, D ;
BODLUNDRINGSTROM, B .
NUCLEAR INSTRUMENTS & METHODS, 1979, 160 (01) :131-136