共 16 条
[1]
DEPTH SELECTIVE MOSSBAUER-EFFECT MEASUREMENTS BY MEANS OF SCATTERED ELECTRONS
[J].
NUCLEAR INSTRUMENTS & METHODS,
1974, 115 (02)
:373-380
[2]
ELECTROSTATIC SPECTROMETER FOR CONVERSION ELECTRON MOSSBAUER-SPECTROSCOPY
[J].
NUCLEAR INSTRUMENTS & METHODS,
1978, 154 (02)
:401-403
[3]
SIMPLE METHOD FOR ANALYSIS OF DEPTH-SELECTIVE MOSSBAUER-EFFECT MEASUREMENTS
[J].
NUCLEAR INSTRUMENTS & METHODS,
1974, 118 (01)
:313-316
[4]
BENCZERKOLLER N, 1977, 1977 WORKSH NEW DIR, V38, P107
[5]
METHOD OF ANALYSIS OF THIN SURFACE LAYERS BY MOSSBAUER EFFECT
[J].
NUCLEAR INSTRUMENTS & METHODS,
1969, 70 (01)
:36-&
[6]
DOMKE M, 5TH P INT C HYP INT
[7]
Ibach H., 1977, Electron spectroscopy for surface analysis, P1
[8]
ANALYSIS OF BACKSCATTER MOSSBAUER-SPECTRA OBTAINED WITH INTERNAL-CONVERSION ELECTRONS
[J].
NUCLEAR INSTRUMENTS & METHODS,
1972, 100 (01)
:93-+
[9]
ANALYSIS OF ELECTRON-TRANSPORT IN CONVERSION ELECTRON MOSSBAUER-SPECTROSCOPY (CEMS)
[J].
NUCLEAR INSTRUMENTS & METHODS,
1978, 155 (03)
:529-538
[10]
INTERPRETATION AND PRACTICAL ANALYSIS OF DEPTH SELECTIVE CONVERSION ELECTRON MOSSBAUER-SPECTRA
[J].
NUCLEAR INSTRUMENTS & METHODS,
1979, 160 (01)
:131-136