AMORPHOUS HYDROGENATED CARBON-FILMS ON SEMICONDUCTORS .1. ELECTRONIC-PROPERTIES OF THE INTERFACE

被引：30

作者：

UGOLINI, D ^{[1
]}

EITLE, J ^{[1
]}

OELHAFEN, P ^{[1
]}

WITTMER, M ^{[1
]}

机构：

[1] IBM CORP, THOMAS J WATSON RES CTR, YORKTOWN HTS, NY 10598 USA

来源：

APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING | 1989年 / 48卷 / 06期

关键词：

D O I：

10.1007/BF00617856

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：549 / 558

页数：10

共 27 条

[1] ANGUS JC, 1987, AMORPHOUS HYDROGENAT, P167
[2] RELAXATION DURING PHOTOEMISSION AND LMM AUGER DECAY IN ARSENIC AND SOME OF ITS COMPOUNDS
BAHL, MK
WOODALL, RO
WATSON, RL
IRGOLIC, KJ
[J]. JOURNAL OF CHEMICAL PHYSICS, 1976, 64 (03) : 1210 - 1218
[3] SURFACE, INTERFACE, AND BULK PROPERTIES OF AMORPHOUS-CARBON FILMS CHARACTERIZED BY INSITU ELLIPSOMETRY
COLLINS, RW
[J]. APPLIED PHYSICS LETTERS, 1988, 52 (24) : 2025 - 2027
[4] CRESCENZI MG, 1981, SOLID STATE COMMUN, V51, P811
[5] BONDING IN HYDROGENATED HARD CARBON STUDIED BY OPTICAL SPECTROSCOPY
DISCHLER, B
BUBENZER, A
KOIDL, P
[J]. SOLID STATE COMMUNICATIONS, 1983, 48 (02) : 105 - 108
[6] Kowalczyk S.P., 1976, THESIS U CALIFORNIA
[7] LETTINGTON AH, 1987, AMORPHOUS HYDROGENAT, P359
[8] TOTAL VALENCE-BAND DENSITIES OF STATES OF III-V AND II-VI COMPOUNDS FROM X-RAY PHOTOEMISSION SPECTROSCOPY
LEY, L
POLLAK, RA
MCFEELY, FR
KOWALCZY.SP
SHIRLEY, DA
[J]. PHYSICAL REVIEW B, 1974, 9 (02): : 600 - 621
[9] ELECTRONIC-STRUCTURE OF SUPPORTED SMALL METAL-CLUSTERS
MASON, MG
[J]. PHYSICAL REVIEW B, 1983, 27 (02): : 748 - 762
[10] OELHAFEN P, 1987, AMORPHOUS HYDROGENAT, P267